Display Abstract

Title Microlocal analysis of artifacts in limited anlge x-ray tomography

Name J\"urgen Frikel
Country Germany
Email j.frikel@gmx.de
Co-Author(s) Eric Todd Quinto (Tufts University)
Submit Time 2014-01-23 08:04:51
Special Session 45: Hybrid imaging methods
In many tomographic imaging scenarios (e.g. x-ray tomography, electron microscopy, photo- and thermoacoustic tomgraphy) only limited-view data is available. As a consequence, only specific features of the unknown object can be reconstructed reliable, and artifacts can be generated. In this talk, we will use microlocal analysis to explain that artifacts might appear only along lines that are tangent to singularities of the original object. Moreover, we will show that by smoothly truncating the data at the ends of the angular range, the artifacts can be reduced.