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August  2012, 6(3): 465-486. doi: 10.3934/ipi.2012.6.465

On the inverse doping profile problem

Victor Isakov 1, and  Joseph Myers 2,

1. 

Wichita State University, 1845 Fairmount, Wichita, KS 67260-0033, United States
2. 

Friends University, 2100 W University Ave, Wichita, KS 67213, United States

Received  April 2011 Revised  February 2012 Published  September 2012

We obtain new analytic results for the problem of the recovery of a doped region $D$ in semiconductor devices from the total flux of electrons/holes through a part of the boundary for various applied potentials on some complementary part of the boundary. We consider the stationary two-dimensional case and we use the index of the gradient of solutions of the linear elliptic equation modeling a unipolar device. Under mild assumptions we prove local uniqueness of smooth $D$ and global uniqueness of polygonal $D$ satisfying some geometrical (star-shapednedness or convexity in some direction) assumptions. We design a nonlinear minimization algorithm for numerical solution and we demonstrate its effectiveness on some basic examples. An essential ingredient of this algorithm is a numerical solution of the direct problem by using single layer potentials.
Keywords: Inverse problems, inverse scattering problems..
Mathematics Subject Classification: Primary: 35R30; Secondary: 78A4.
Citation: Victor Isakov, Joseph Myers. On the inverse doping profile problem. Inverse Problems & Imaging, 2012, 6 (3) : 465-486. doi: 10.3934/ipi.2012.6.465
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show all references

References:
[1]

Trans. of AMS, 347 (1995), 3031-3041. doi: 10.1090/S0002-9947-1995-1303113-8.  Google Scholar

[2]

SIAM J. Math. Anal., 25 (1994), 1259-1269. doi: 10.1137/S0036141093249080.  Google Scholar

[3]

Inverse Problems, 17 (2001), 1765-1795. doi: 10.1088/0266-5611/17/6/315.  Google Scholar

[4]

Milan J. of Mathematics, 72 (2004), 273-314. doi: 10.1007/s00032-004-0025-6.  Google Scholar

[5]

VSP, Utrecht, 1996.  Google Scholar

[6]

SIAM J. Appl. Math., 62 (2002), 2149-2174. doi: 10.1137/S003613990139249X.  Google Scholar

[7]

AMS, Providence, RI, 1990.  Google Scholar

[8]

Springer-Verlag, New York, 2006.  Google Scholar

[9]

Inverse Problems Imaging, 1 (2007), 95-107.  Google Scholar

[10]

Contemp. Math. AMS, 494 (2009), 123-137. doi: 10.1090/conm/494/09647.  Google Scholar

[11]

Inverse Problems, 13 (1997), 113-123. doi: 10.1088/0266-5611/13/1/009.  Google Scholar

[12]

SIAM J. Optim., 9 (1998), 112-147.  Google Scholar

[13]

Inverse Problems, 22 (2006), 1071-1088. doi: 10.1088/0266-5611/22/3/021.  Google Scholar

[14]

Springer-Verlag, Vienna, 1990.  Google Scholar

[15]

Nordhoff, Holland, 1953.  Google Scholar

[16]

Technometrics, 7 (1975), 45-51. Google Scholar

[17]

Springer-Verlag, 1997  Google Scholar

[18]

J. Comp. Electronics, 22 (2007), 409-420. doi: 10.1007/s10825-007-0149-3.  Google Scholar

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